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When good trigger circuits go bad: A case history

When good trigger circuits go bad: A case history,Alex Gerdemann,James W. Miller,Michael Stockinger,Norman Herr,Allan Dobbin,Reyhan Ricklefs

When good trigger circuits go bad: A case history  
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A case history is presented of an advanced latched dual time constant ESD transient trigger circuit design. An unexpected failure occurred with this design which interfered with functional operation of the device. Analysis of the failure is presented along with successful circuit fixes and techniques that ensure safe operation of these circuits.
Published in 2011.
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