The Materials Analysis patticle Probe (MAPP) diagnostic system in NSTX

The Materials Analysis patticle Probe (MAPP) diagnostic system in NSTX,10.1109/SOFE.2011.6052303,Bryan Heim,S. Gonderman,C. N Taylor,J. P Allain,Z. C.

The Materials Analysis patticle Probe (MAPP) diagnostic system in NSTX  
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Bryan Heim, S. Gonderman, C. N Taylor, J. P Allain, Z. C. Yang, M. Gonzalez, E. Collins, C. H. Skinner, B. Ellis, W. Blanchard, L. Roquemore, H. W Kugel
Lithium conditioning of plasma-facing surfaces (PFS) has been implemented in NSTX leading to improvements in plasma performance such as reduced D recycling and a reduction in edge localized modes (ELMS). Analysis of post-mortem tiles and offline experiments has identified interactions between Li-O-D and Li-C-D as chemical channels for deuterium retention in AT J graphite. MAPP is the first in-vacuo surface analysis diagnostic directly integrated into a tokamak and capable of shot-to-shot chemical surface analysis of plasma material interactions (PM I). X-ray photoelectron spectroscopy (XPS) and low energy ion surface spectroscopy (LEISS) can show the chemical functionalities between D and Iithiated graphite at both the near surface (5-10 nm) and top surface layer (0.3-0.6 nm) for XPS and LEISS respectively. MAPP will correlate plasma facing component (PFC) surface chemistry with plasma performance to lead the way to improved understanding of plasma-surface interactions and their effect on global plasma performance. Remote operation and data acquisition, integrated into NSTX diagnostic and interlocks, make MAPP an advanced PMI diagnostic with stringent engineering constraints.
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