<?xml version="1.0" encoding="utf-8"?><rss version="2.0"><channel><title>RSS for Petar Igic</title><link>http://academic.research.microsoft.com/Rss.aspx?id=12624281</link><description>Search RSS feed for Microsoft Academic Search</description><generator>MSRA Libra RSS Burner</generator><copyright>(c)2008 Microsoft Corpration, All right reserved.</copyright><pubDate>Mon, 20 May 2013 11:25:37 GMT</pubDate><lastBuildDate>Mon, 20 May 2013 11:25:37 GMT</lastBuildDate><category /><item><title>Petar Igic (Personal Info)
      </title><link>http://academic.research.microsoft.com/Author/12624281</link><pubDate>Mon, 20 May 2013 11:25:37 GMT</pubDate><description><![CDATA[<p>Swansea University<br/></p><p>
          Publications: 60</p><p>
          Citation Count: 122</p><p>
          G-index: 7</p><p>
         Field Rating: 6</p><p>Fields of study: <a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=8&subDomainID=6&last=0&start=1&end=100">Electrical &#38; Electronic Engineering</a><span class="span-break" >,&nbsp;</span><a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=19&subDomainID=0&last=0&start=1&end=100">Physics</a><span class="span-break" >,&nbsp;</span><a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=2&subDomainID=3&last=0&start=1&end=100">Hardware &#38; Architecture</a><br/></p><p>Homepage:
        <a href="http://www.swan.ac.uk/staff/academic/engineering/igicpetar/">http://www.swan.ac.uk/staff/academic/engineering/igicpetar/</a></p><p>
          Permanent Link:
          <a href="http://academic.research.microsoft.com/Author/12624281">http://academic.research.microsoft.com/Author/12624281</a></p>]]></description><guid isPermaLink="false">1262446367http://www.swan.ac.uk/staff/academic/engineering/igicpetar/Swansea University</guid></item><item><title>Modification of Schottky interface by the inclusion of DNA interlayer to create metal / organic / inorganic structures</title><link>http://academic.research.microsoft.com/Publication/56979235</link><pubDate>Mon, 20 May 2013 11:25:37 GMT</pubDate><guid isPermaLink="false">1262428156979235</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22258651'>Stephen Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/2050411'>John Wills</a>,  <a href='http://academic.research.microsoft.com/Author/49276129'>Michal Lodzinski</a>,  <a href='http://academic.research.microsoft.com/Author/57127372'>Chris Wright</a>,  <a href='http://academic.research.microsoft.com/Author/49498617'>Shareen Doak</a>,  <a href='http://academic.research.microsoft.com/Author/53687245'>Paul Holland</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>MIEL, 2012</p><p />]]></description></item><item><title>LDMOSFET with drain potential suppression for 100 V Power IC technology</title><link>http://academic.research.microsoft.com/Publication/39332189</link><pubDate>Mon, 20 May 2013 11:25:36 GMT</pubDate><guid isPermaLink="false">1262428139332189</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/10565328'>P. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/50310108'>M. Elwin</a>,  <a href='http://academic.research.microsoft.com/Author/9144581'>I. Anteney</a>,  <a href='http://academic.research.microsoft.com/Author/1392700'>J. Ellis</a>,  <a href='http://academic.research.microsoft.com/Author/1287672'>L. Armstrong</a>,  <a href='http://academic.research.microsoft.com/Author/34089309'>G. Birchby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>Microelectronics Reliability, vol. 51, no. 3, pp. 529-535, 2011</p><p />]]></description></item><item><title>A predictive dead-beat PI current controller for active power filters</title><link>http://academic.research.microsoft.com/Publication/51129320</link><pubDate>Mon, 20 May 2013 11:25:35 GMT</pubDate><guid isPermaLink="false">1262428151129320</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/2402653'>C. Wang</a>,  <a href='http://academic.research.microsoft.com/Author/22258650'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/80533'>Y. Liu</a>,  <a href='http://academic.research.microsoft.com/Author/53275620'>M. S. Kanniche</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/53412332'>R. P. Lewis</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. G. Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>2011</p><p />]]></description></item><item><title>Perspective on Power IC technology: From design lab to wafer fab</title><link>http://academic.research.microsoft.com/Publication/50894675</link><pubDate>Mon, 20 May 2013 11:25:34 GMT</pubDate><guid isPermaLink="false">1262428150894675</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/50310108'>M. P. Elwin</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a></dl><p></p><p>MIEL, 2010</p><p>(Citations:1)</p>]]></description></item><item><title>Compact model of the IGBTs with localized lifetime control dedicated to power circuit simulations</title><link>http://academic.research.microsoft.com/Publication/18434962</link><pubDate>Mon, 20 May 2013 11:25:33 GMT</pubDate><guid isPermaLink="false">1262428118434962</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/19016791'>Nebojsa Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a>,  <a href='http://academic.research.microsoft.com/Author/81598'>Naoki Sakurai</a></dl><p></p><p>SOLID STATE ELECTRON, vol. 54, no. 3, pp. 268-274, 2010</p><p />]]></description></item><item><title>High-speed electro-thermal modelling of a three-phase insulated gate bipolar transistor inverter power module</title><link>http://academic.research.microsoft.com/Publication/26944227</link><pubDate>Mon, 20 May 2013 11:25:32 GMT</pubDate><guid isPermaLink="false">1262428126944227</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22258650'>Zhongfu Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>INT J ELECTRON, vol. 97, no. 2, pp. 195-205, 2010</p><p />]]></description></item><item><title>Optimisation of 100V high side LDMOS using multiple simulation techniques</title><link>http://academic.research.microsoft.com/Publication/50766779</link><pubDate>Mon, 20 May 2013 11:25:31 GMT</pubDate><guid isPermaLink="false">1262428150766779</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/50310108'>M. Elwin</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/9144581'>I. Anteney</a>,  <a href='http://academic.research.microsoft.com/Author/1392700'>J. Ellis</a>,  <a href='http://academic.research.microsoft.com/Author/1287672'>L. Armstrong</a>,  <a href='http://academic.research.microsoft.com/Author/34089309'>G. Birchby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>ISPSD, pp. 104-107, 2009</p><p>(Citations:1)</p>]]></description></item><item><title>Assessment of communication methods for smart electricity metering in the U.K</title><link>http://academic.research.microsoft.com/Publication/50868342</link><pubDate>Mon, 20 May 2013 11:25:30 GMT</pubDate><guid isPermaLink="false">1262428150868342</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53412332'>Richard Peter Lewis</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a>,  <a href='http://academic.research.microsoft.com/Author/22258650'>Zhongfu Zhou</a></dl><p></p><p>SAE, 2009</p><p>(Citations:2)</p>]]></description></item><item><title>Design and analysis of a feedforward control scheme for a three-phase voltage source pulse width modulation rectifier using sensorless load current signal</title><link>http://academic.research.microsoft.com/Publication/26860408</link><pubDate>Mon, 20 May 2013 11:25:29 GMT</pubDate><guid isPermaLink="false">1262428126860408</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/54997130'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/35225928'>P. J. Unsworth</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>IET POWER ELECTRON, vol. 2, no. 4, 2009</p><p />]]></description></item><item><title>An advanced physics-based sub-circuit model of a punch-trough insulated gate bipolar transistor</title><link>http://academic.research.microsoft.com/Publication/26944157</link><pubDate>Mon, 20 May 2013 11:25:28 GMT</pubDate><guid isPermaLink="false">1262428126944157</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/19016791'>Nebojsa Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/22258650'>Zhongfu Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/22258651'>Steve Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>INT J ELECTRON, vol. 96, no. 7, pp. 767-779, 2009</p><p />]]></description></item><item><title>Permanent magnet generator control and electrical system configuration for Wave Dragon MW wave energy take-off system</title><link>http://academic.research.microsoft.com/Publication/50702591</link><pubDate>Mon, 20 May 2013 11:25:27 GMT</pubDate><guid isPermaLink="false">1262428150702591</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22258650'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/52683313'>W. Knapp</a>,  <a href='http://academic.research.microsoft.com/Author/55310494'>J. MacEnri</a>,  <a href='http://academic.research.microsoft.com/Author/23147140'>H. C. Sorensen</a>,  <a href='http://academic.research.microsoft.com/Author/56066372'>E. Friis Madsen</a>,  <a href='http://academic.research.microsoft.com/Author/13243063'>I. Masters</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>2008</p><p>(Citations:2)</p>]]></description></item><item><title>Silicon carbide Schottky diodes and MOSFETs: Solutions to performance problems</title><link>http://academic.research.microsoft.com/Publication/50690225</link><pubDate>Mon, 20 May 2013 11:25:26 GMT</pubDate><guid isPermaLink="false">1262428150690225</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/20350709'>Owen J. Guy</a>,  <a href='http://academic.research.microsoft.com/Author/49276129'>Michal Lodzinski</a>,  <a href='http://academic.research.microsoft.com/Author/52825325'>Ambroise Castaing</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12628286'>Amador Perez-Tomas</a>,  <a href='http://academic.research.microsoft.com/Author/13238425'>M. R. Jennings</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>EPE-PEMC, 2008</p><p>(Citations:2)</p>]]></description></item><item><title>X-ray photoelectron spectroscopy studies on the formation of chromium contacts to single-crystal CVD diamond</title><link>http://academic.research.microsoft.com/Publication/22973232</link><pubDate>Mon, 20 May 2013 11:25:25 GMT</pubDate><guid isPermaLink="false">1262428122973232</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/3598513'>D. Doneddu</a>,  <a href='http://academic.research.microsoft.com/Author/20350709'>O. J. Guy</a>,  <a href='http://academic.research.microsoft.com/Author/53193235'>P. R. Dunstan</a>,  <a href='http://academic.research.microsoft.com/Author/42686525'>T. G. G. Maffeis</a>,  <a href='http://academic.research.microsoft.com/Author/19014497'>K. S. Teng</a>,  <a href='http://academic.research.microsoft.com/Author/4466594'>S. P. Wilks</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/76277'>D. Twitchen</a>,  <a href='http://academic.research.microsoft.com/Author/54905613'>R. M. Clement</a></dl><p></p><p>SURFACE SCI, vol. 602, no. 6, pp. 1135-1140, 2008</p><p>(Citations:1)</p>]]></description></item><item><title>A study of latch-up robustness for a new p-buffer CMOS based Power IC Technology architecture</title><link>http://academic.research.microsoft.com/Publication/50657425</link><pubDate>Mon, 20 May 2013 11:25:24 GMT</pubDate><guid isPermaLink="false">1262428150657425</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/50310108'>M. P. Elwin</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/54997130'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a></dl><p></p><p>MIEL, 2008</p><p />]]></description></item><item><title>Compact thermal model of a three-phase IGBT inverter power module</title><link>http://academic.research.microsoft.com/Publication/50657423</link><pubDate>Mon, 20 May 2013 11:25:23 GMT</pubDate><guid isPermaLink="false">1262428150657423</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22258650'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>MIEL, 2008</p><p />]]></description></item><item><title>Characterization of MOS interfaces on protected and unprotected 4H-SiC surfaces</title><link>http://academic.research.microsoft.com/Publication/50657498</link><pubDate>Mon, 20 May 2013 11:25:22 GMT</pubDate><guid isPermaLink="false">1262428150657498</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/49276129'>M. Lodzinski</a>,  <a href='http://academic.research.microsoft.com/Author/12628286'>A. Perez-Tomas</a>,  <a href='http://academic.research.microsoft.com/Author/20350709'>O. J. Guy</a>,  <a href='http://academic.research.microsoft.com/Author/45936413'>M. Penny</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/56143812'>O. A. Al-Hartomy</a>,  <a href='http://academic.research.microsoft.com/Author/53193235'>P. Dunstan</a>,  <a href='http://academic.research.microsoft.com/Author/4466594'>S. Wilks</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>MIEL, 2008</p><p />]]></description></item><item><title>Current space vector amplitude fluctuation based sensorless speed measurement of induction machines using Short Time Fourier Transformation</title><link>http://academic.research.microsoft.com/Publication/50727032</link><pubDate>Mon, 20 May 2013 11:25:21 GMT</pubDate><guid isPermaLink="false">1262428150727032</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53726449'>Chun Wang</a>,  <a href='http://academic.research.microsoft.com/Author/22258650'>Zhongfu Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/35225928'>Peter J Unsworth</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>2008</p><p />]]></description></item><item><title>Study of a novel Si/SiC hetero-junction MOSFET</title><link>http://academic.research.microsoft.com/Publication/18434099</link><pubDate>Mon, 20 May 2013 11:25:20 GMT</pubDate><guid isPermaLink="false">1262428118434099</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/13029020'>L. Chen</a>,  <a href='http://academic.research.microsoft.com/Author/54899895'>O. J. Guy</a>,  <a href='http://academic.research.microsoft.com/Author/53981361'>M. R. Jennings</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/18832711'>S. P. Wilks</a>,  <a href='http://academic.research.microsoft.com/Author/54576195'>P. A. Mawby</a></dl><p></p><p>SOLID STATE ELECTRON, vol. 51, no. 5, pp. 662-666, 2007</p><p>(Citations:4)</p>]]></description></item><item><title>A p+/p-buffer/n-epi cmos compatible high-side RESURF LDMOS transistor for Power IC applications</title><link>http://academic.research.microsoft.com/Publication/4422932</link><pubDate>Mon, 20 May 2013 11:25:19 GMT</pubDate><guid isPermaLink="false">126242814422932</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/10565328'>P. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>Microelectronics Journal, vol. 38, no. 6-7, pp. 762-766, 2007</p><p>(Citations:3)</p>]]></description></item><item><title>Unified Approach in ElectroThermal Modelling of IGBTs and Power PiN Diodes</title><link>http://academic.research.microsoft.com/Publication/50576034</link><pubDate>Mon, 20 May 2013 11:25:18 GMT</pubDate><guid isPermaLink="false">1262428150576034</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/19016791'>Nebojsa Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/21139721'>Takashi Ueta</a>,  <a href='http://academic.research.microsoft.com/Author/18504567'>Kimimori Hamada</a>,  <a href='http://academic.research.microsoft.com/Author/52464210'>Toshifumi Nishijima</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>ISPSD, 2007</p><p>(Citations:2)</p>]]></description></item><item><title>Electro-osmotic Flow Based Cooling System For Microprocessors</title><link>http://academic.research.microsoft.com/Publication/50561351</link><pubDate>Mon, 20 May 2013 11:25:17 GMT</pubDate><guid isPermaLink="false">1262428150561351</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/24213495'>P. F. Eng</a>,  <a href='http://academic.research.microsoft.com/Author/12803841'>P. Nithiarasu</a>,  <a href='http://academic.research.microsoft.com/Author/23109514'>A. K. Arnold</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/20350709'>O. J. Guy</a></dl><p></p><p>EuroSimE, 2007</p><p>(Citations:3)</p>]]></description></item><item><title>All injection level power PiN diode model including temperature dependence</title><link>http://academic.research.microsoft.com/Publication/18434108</link><pubDate>Mon, 20 May 2013 11:25:16 GMT</pubDate><guid isPermaLink="false">1262428118434108</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/19016791'>Nebojsa Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/55658140'>Tatjana Pesic</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>SOLID STATE ELECTRON, vol. 51, no. 5, pp. 719-725, 2007</p><p>(Citations:2)</p>]]></description></item><item><title>A fast power loss calculation method for long real time thermal simulation of IGBT modules for a three-phase inverter system</title><link>http://academic.research.microsoft.com/Publication/26061713</link><pubDate>Mon, 20 May 2013 11:25:15 GMT</pubDate><guid isPermaLink="false">1262428126061713</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/54997130'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/18251473'>M. S. Khanniche</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/1934857'>S. T. Kong</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>INT J NUMER MODEL ELECTRON N, vol. 19, no. 1, pp. 33-46, 2006</p><p>(Citations:8)</p>]]></description></item><item><title>Operating frequency and grounding issues regarding active junction isolation in the power integrated circuits</title><link>http://academic.research.microsoft.com/Publication/26850563</link><pubDate>Mon, 20 May 2013 11:25:14 GMT</pubDate><guid isPermaLink="false">1262428126850563</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/1454927'>T. K. H. Starke</a></dl><p></p><p>IEE PROC-CIRCUITS DEVICE SYST, vol. 153, no. 1, 2006</p><p>(Citations:3)</p>]]></description></item><item><title>Technology for Power Integrated Circuits with Multiple Vertical Power Devices</title><link>http://academic.research.microsoft.com/Publication/50491324</link><pubDate>Mon, 20 May 2013 11:25:13 GMT</pubDate><guid isPermaLink="false">1262428150491324</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/12886122'>R. Lerner</a>,  <a href='http://academic.research.microsoft.com/Author/56460139'>A. Menz</a></dl><p></p><p>ISPSD, 2006</p><p>(Citations:3)</p>]]></description></item><item><title>Dynamic Thermal Simulation of Power Devices Operating with PWM Signals in a Three-Phase Inverter Drive System</title><link>http://academic.research.microsoft.com/Publication/50556692</link><pubDate>Mon, 20 May 2013 11:25:12 GMT</pubDate><guid isPermaLink="false">1262428150556692</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22258650'>Zhongfu Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/56126675'>Salah Khanniche</a>,  <a href='http://academic.research.microsoft.com/Author/19016791'>Nebojsa Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/22258651'>Stephen Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>EPE-PEMC, 2006</p><p>(Citations:1)</p>]]></description></item><item><title>Schottky Contacts on Single-Crystal CVD Diamond</title><link>http://academic.research.microsoft.com/Publication/50487167</link><pubDate>Mon, 20 May 2013 11:25:11 GMT</pubDate><guid isPermaLink="false">1262428150487167</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/3598513'>D. Doneddu</a>,  <a href='http://academic.research.microsoft.com/Author/20350709'>O. J. Guy</a>,  <a href='http://academic.research.microsoft.com/Author/76277'>D. Twitchen</a>,  <a href='http://academic.research.microsoft.com/Author/21856907'>A. Tajani</a>,  <a href='http://academic.research.microsoft.com/Author/12627966'>M. Schwitters</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>MIEL, 2006</p><p>(Citations:1)</p>]]></description></item><item><title>An Alternative Process Architecture for CMOS Based High Side RESURF LDMOS Transistors</title><link>http://academic.research.microsoft.com/Publication/50487171</link><pubDate>Mon, 20 May 2013 11:25:10 GMT</pubDate><guid isPermaLink="false">1262428150487171</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a></dl><p></p><p>MIEL, 2006</p><p>(Citations:1)</p>]]></description></item><item><title>Measurement and modelling of power electronic devices at cryogenic temperatures</title><link>http://academic.research.microsoft.com/Publication/26850609</link><pubDate>Mon, 20 May 2013 11:25:09 GMT</pubDate><guid isPermaLink="false">1262428126850609</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53194796'>A. J. Forsyth</a>,  <a href='http://academic.research.microsoft.com/Author/21648505'>S. Y. Yang</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>IEE PROC-CIRCUITS DEVICE SYST, vol. 153, no. 5, 2006</p><p>(Citations:1)</p>]]></description></item><item><title>Dynamic Thermal Simulation of Power Devices Operating with PWM Signals</title><link>http://academic.research.microsoft.com/Publication/50487168</link><pubDate>Mon, 20 May 2013 11:25:08 GMT</pubDate><guid isPermaLink="false">1262428150487168</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22258650'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/18251473'>M. S. Khanniche</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/49719774'>S. N. Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. G. Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>MIEL, 2006</p><p />]]></description></item><item><title>An Advance Physics-Based SubCircuit Model of IGBT</title><link>http://academic.research.microsoft.com/Publication/50511529</link><pubDate>Mon, 20 May 2013 11:25:07 GMT</pubDate><guid isPermaLink="false">1262428150511529</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/49717425'>Nebojsa Jankovic</a>,  <a href='http://academic.research.microsoft.com/Author/56510473'>Zhongfu Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/50357886'>Steve Batcup</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>2006</p><p />]]></description></item><item><title>Induction Motor Sensorless Speed Estimation by Space Vector Angular Fluctuation</title><link>http://academic.research.microsoft.com/Publication/50556719</link><pubDate>Mon, 20 May 2013 11:25:06 GMT</pubDate><guid isPermaLink="false">1262428150556719</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53726449'>Chun Wang</a>,  <a href='http://academic.research.microsoft.com/Author/22258650'>Zhongfu Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/35225928'>Peter Unsworth</a>,  <a href='http://academic.research.microsoft.com/Author/53687245'>Paul Holland</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar Igic</a></dl><p></p><p>EPE-PEMC, 2006</p><p />]]></description></item><item><title>A fast power loss calculation method for long real time thermal simulation of IGBT modules for a three-phase inverter system</title><link>http://academic.research.microsoft.com/Publication/50464107</link><pubDate>Mon, 20 May 2013 11:25:05 GMT</pubDate><guid isPermaLink="false">1262428150464107</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/54997130'>Z. Zhou</a>,  <a href='http://academic.research.microsoft.com/Author/18251473'>M. S. Khanniche</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/1934857'>S. T. Kong</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>EPE, 2005</p><p>(Citations:7)</p>]]></description></item><item><title>Transient blocking characteristics of highly efficient junction isolations based on standard CMOS process</title><link>http://academic.research.microsoft.com/Publication/18433640</link><pubDate>Mon, 20 May 2013 11:25:04 GMT</pubDate><guid isPermaLink="false">1262428118433640</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53894417'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a></dl><p></p><p>SOLID STATE ELECTRON, vol. 49, no. 7, pp. 1217-1222, 2005</p><p>(Citations:2)</p>]]></description></item><item><title>Study of 4H–SiC trench MOSFET structures</title><link>http://academic.research.microsoft.com/Publication/18433620</link><pubDate>Mon, 20 May 2013 11:25:03 GMT</pubDate><guid isPermaLink="false">1262428118433620</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/13029020'>L. Chen</a>,  <a href='http://academic.research.microsoft.com/Author/54899895'>O. J. Guy</a>,  <a href='http://academic.research.microsoft.com/Author/53981361'>M. R. Jennings</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/18832711'>S. P. Wilks</a>,  <a href='http://academic.research.microsoft.com/Author/54576195'>P. A. Mawby</a></dl><p></p><p>SOLID STATE ELECTRON, vol. 49, no. 7, pp. 1081-1085, 2005</p><p>(Citations:2)</p>]]></description></item><item><title>Feedback supported isolation structure for blocking of minority leakage carriers in power integrated circuits</title><link>http://academic.research.microsoft.com/Publication/2524949</link><pubDate>Mon, 20 May 2013 11:25:02 GMT</pubDate><guid isPermaLink="false">126242812524949</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/1454927'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. Igic</a></dl><p></p><p>Microelectronics Journal, vol. 36, no. 8, pp. 729-731, 2005</p><p>(Citations:1)</p>]]></description></item><item><title>Highly effective junction isolation structures for PICs based on standard CMOS Process</title><link>http://academic.research.microsoft.com/Publication/1445763</link><pubDate>Mon, 20 May 2013 11:25:01 GMT</pubDate><guid isPermaLink="false">126242811445763</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/1454927'>Thomas K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/53687245'>Paul M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/53556657'>Shahzad Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/1597885'>W. M. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>Petar M. Igic</a></dl><p></p><p>IEEE TRANS ELECTRON DEVICES, vol. 51, no. 7, pp. 1178-1184, 2004</p><p>(Citations:6)</p>]]></description></item><item><title>Physically based 2D compact model for power bipolar devices</title><link>http://academic.research.microsoft.com/Publication/26061667</link><pubDate>Mon, 20 May 2013 11:25:00 GMT</pubDate><guid isPermaLink="false">1262428126061667</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>INT J NUMER MODEL ELECTRON N, vol. 17, no. 4, pp. 397-405, 2004</p><p>(Citations:3)</p>]]></description></item><item><title>A 2D physically based compact model for advanced power bipolar devices</title><link>http://academic.research.microsoft.com/Publication/2525111</link><pubDate>Mon, 20 May 2013 11:24:59 GMT</pubDate><guid isPermaLink="false">126242812525111</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>Microelectronics Journal, vol. 35, no. 7, pp. 591-594, 2004</p><p>(Citations:2)</p>]]></description></item><item><title>Active junction isolation for smart power integrated circuits</title><link>http://academic.research.microsoft.com/Publication/56819172</link><pubDate>Mon, 20 May 2013 11:24:58 GMT</pubDate><guid isPermaLink="false">1262428156819172</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/51239511'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/53383638'>S. Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/51077400'>W. M. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/52228845'>P. A. Mawby</a></dl><p></p><p>2004</p><p />]]></description></item><item><title>Highly Effective Junction Isolation Structures for PICs Based on Standard CMOS Process</title><link>http://academic.research.microsoft.com/Publication/52456555</link><pubDate>Mon, 20 May 2013 11:24:57 GMT</pubDate><guid isPermaLink="false">1262428152456555</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/1454927'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/53556657'>S. Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/1597885'>W. M. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a></dl><p></p><p>IEEE TRANS ELECTRON DEVICES, vol. 51, pp. 1178-1184, 2004</p><p />]]></description></item><item><title>Advanced junction isolation structures for Power Integrated Circuit technology</title><link>http://academic.research.microsoft.com/Publication/50362797</link><pubDate>Mon, 20 May 2013 11:24:56 GMT</pubDate><guid isPermaLink="false">1262428150362797</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/1454927'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/53556657'>S. Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/1597885'>W. M. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a></dl><p></p><p>MIEL, 2004</p><p />]]></description></item><item><title>Novel 2-D RESURF LDMOSFET in 0.6 μm CMOS technology for power ICs</title><link>http://academic.research.microsoft.com/Publication/50362812</link><pubDate>Mon, 20 May 2013 11:24:55 GMT</pubDate><guid isPermaLink="false">1262428150362812</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/1454927'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/53556657'>S. Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/1597885'>W. M. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a></dl><p></p><p>MIEL, 2004</p><p />]]></description></item><item><title>Active junction isolation for smart power integrated circuits</title><link>http://academic.research.microsoft.com/Publication/52601595</link><pubDate>Mon, 20 May 2013 11:24:54 GMT</pubDate><guid isPermaLink="false">1262428152601595</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53894417'>T. K. H. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/49185767'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/19898001'>S. Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/46453824'>W. M. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/54576195'>P. A. Mawby</a></dl><p></p><p>APPL PHYS LETT, vol. 84, 2004</p><p />]]></description></item><item><title>New physically-based PiN diode compact model for circuit modelling applications</title><link>http://academic.research.microsoft.com/Publication/26850263</link><pubDate>Mon, 20 May 2013 11:24:53 GMT</pubDate><guid isPermaLink="false">1262428126850263</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. Batcup</a></dl><p></p><p>IEE PROC-CIRCUITS DEVICE SYST, vol. 149, no. 4, 2002</p><p>(Citations:10)</p>]]></description></item><item><title>Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model</title><link>http://academic.research.microsoft.com/Publication/2523392</link><pubDate>Mon, 20 May 2013 11:24:52 GMT</pubDate><guid isPermaLink="false">126242812523392</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/1597885'>W. Jamal</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. G. J. Batcup</a></dl><p></p><p>Microelectronics Reliability, vol. 42, no. 7, pp. 1045-1052, 2002</p><p>(Citations:6)</p>]]></description></item><item><title>Thermal model of power semiconductor devices for electro-thermal circuit simulations</title><link>http://academic.research.microsoft.com/Publication/50263340</link><pubDate>Mon, 20 May 2013 11:24:51 GMT</pubDate><guid isPermaLink="false">1262428150263340</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. Batcup</a></dl><p></p><p>MIEL, 2002</p><p>(Citations:2)</p>]]></description></item><item><title>New LDMOS transistor based on 0.6 μ CMOS technology for power IC applications</title><link>http://academic.research.microsoft.com/Publication/50301250</link><pubDate>Mon, 20 May 2013 11:24:50 GMT</pubDate><guid isPermaLink="false">1262428150301250</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53556657'>S. Hussain</a>,  <a href='http://academic.research.microsoft.com/Author/10565328'>P. M. Holland</a>,  <a href='http://academic.research.microsoft.com/Author/1454927'>T. Starke</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>ICSE, 2002</p><p />]]></description></item><item><title>Dynamic electro-thermal physically based compact models of the power devices for device and circuit simulations</title><link>http://academic.research.microsoft.com/Publication/50222548</link><pubDate>Mon, 20 May 2013 11:24:49 GMT</pubDate><guid isPermaLink="false">1262428150222548</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a>,  <a href='http://academic.research.microsoft.com/Author/3597528'>S. Batcup</a></dl><p></p><p>SEMI-THERM, 2001</p><p>(Citations:9)</p>]]></description></item><item><title>Physics-based dynamic electro-thermal models of power bipolar devices (PiN diode and IGBT)</title><link>http://academic.research.microsoft.com/Publication/50227092</link><pubDate>Mon, 20 May 2013 11:24:48 GMT</pubDate><guid isPermaLink="false">1262428150227092</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a></dl><p></p><p>ISPSD, pp. 381-384, 2001</p><p>(Citations:8)</p>]]></description></item><item><title>Physically based compact device models for circuit modelling applications</title><link>http://academic.research.microsoft.com/Publication/14513187</link><pubDate>Mon, 20 May 2013 11:24:47 GMT</pubDate><guid isPermaLink="false">1262428114513187</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a></dl><p></p><p>Microelectronics Journal, vol. 32, no. 5, pp. 433-447, 2001</p><p>(Citations:6)</p>]]></description></item><item><title>New physics-based compact electro-thermal model of power diode dedicated to circuit simulation</title><link>http://academic.research.microsoft.com/Publication/2452370</link><pubDate>Mon, 20 May 2013 11:24:46 GMT</pubDate><guid isPermaLink="false">126242812452370</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12622172'>M. S. Towers</a></dl><p></p><p>ISCAS, pp. 401-404, 2001</p><p />]]></description></item><item><title>Investigation of the thermal stress field in a multilevel aluminium metallisation in VLSI systems</title><link>http://academic.research.microsoft.com/Publication/14476899</link><pubDate>Mon, 20 May 2013 11:24:45 GMT</pubDate><guid isPermaLink="false">1262428114476899</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a></dl><p></p><p>Microelectronics Reliability, vol. 40, no. 3, pp. 443-450, 2000</p><p>(Citations:5)</p>]]></description></item><item><title>Mechanical stress related instabilities in silicon under metal coverage</title><link>http://academic.research.microsoft.com/Publication/52411549</link><pubDate>Mon, 20 May 2013 11:24:44 GMT</pubDate><guid isPermaLink="false">1262428152411549</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12611510'>R. S. Popovic</a>,  <a href='http://academic.research.microsoft.com/Author/54474962'>Y. Haddab</a>,  <a href='http://academic.research.microsoft.com/Author/12501311'>P. A. Mawby</a>,  <a href='http://academic.research.microsoft.com/Author/12624281'>P. M. Igic</a>,  <a href='http://academic.research.microsoft.com/Author/12611508'>D. 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