<?xml version="1.0" encoding="utf-8"?><rss version="2.0"><channel><title>RSS for Giovanni Basso</title><link>http://academic.research.microsoft.com/Rss.aspx?id=12670804</link><description>Search RSS feed for Microsoft Academic Search</description><generator>MSRA Libra RSS Burner</generator><copyright>(c)2008 Microsoft Corpration, All right reserved.</copyright><pubDate>Sat, 25 May 2013 04:52:39 GMT</pubDate><lastBuildDate>Sat, 25 May 2013 04:52:39 GMT</lastBuildDate><category /><item><title>Giovanni Basso (Personal Info)
      </title><link>http://academic.research.microsoft.com/Author/12670804</link><pubDate>Sat, 25 May 2013 04:52:39 GMT</pubDate><description><![CDATA[<p /><p>
          Publications: 2</p><p>
          Citation Count: 7</p><p>
          G-index: 2</p><p>
         Field Rating: 2</p><p>Fields of study: <a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=8&subDomainID=6&last=0&start=1&end=100">Electrical &#38; Electronic Engineering</a><br/></p><p>Homepage:
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          <a href="http://academic.research.microsoft.com/Author/12670804">http://academic.research.microsoft.com/Author/12670804</a></p>]]></description><guid isPermaLink="false">1267081322</guid></item><item><title>Ultralow-noise programmable voltage source</title><link>http://academic.research.microsoft.com/Publication/1590496</link><pubDate>Sat, 25 May 2013 04:52:39 GMT</pubDate><guid isPermaLink="false">126708041590496</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/2051048'>Luigi Baracchino</a>,  <a href='http://academic.research.microsoft.com/Author/12670804'>Giovanni Basso</a>,  <a href='http://academic.research.microsoft.com/Author/47672524'>Carmine Ciofi</a>,  <a href='http://academic.research.microsoft.com/Author/12626050'>Bruno Neri</a></dl><p></p><p>IEEE TRANS INSTRUM MEAS, vol. 46, no. 6, pp. 1256-1261, 1997</p><p>(Citations:5)</p>]]></description></item><item><title>Very long current transients in reverse-biased almost ideal n+ -p junctions</title><link>http://academic.research.microsoft.com/Publication/1541959</link><pubDate>Sat, 25 May 2013 04:52:38 GMT</pubDate><guid isPermaLink="false">126708041541959</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12670804'>G. Basso</a>,  <a href='http://academic.research.microsoft.com/Author/2153906'>B. Pellegrini</a>,  <a href='http://academic.research.microsoft.com/Author/20989825'>M. L. Polignano</a>,  <a href='http://academic.research.microsoft.com/Author/58209'>R. Saletti</a>,  <a href='http://academic.research.microsoft.com/Author/3386568'>P. Terreni</a></dl><p></p><p>IEEE ELECTRON DEV LETT, vol. 10, no. 1, pp. 36-38, 1989</p><p>(Citations:2)</p>]]></description></item></channel></rss>