<?xml version="1.0" encoding="utf-8"?><rss version="2.0"><channel><title>RSS for Fan-Yun Pai</title><link>http://academic.research.microsoft.com/Rss.aspx?id=21723450</link><description>Search RSS feed for Microsoft Academic Search</description><generator>MSRA Libra RSS Burner</generator><copyright>(c)2008 Microsoft Corpration, All right reserved.</copyright><pubDate>Thu, 23 May 2013 06:14:44 GMT</pubDate><lastBuildDate>Thu, 23 May 2013 06:14:44 GMT</lastBuildDate><category /><item><title>Fan-Yun Pai (Personal Info)
      </title><link>http://academic.research.microsoft.com/Author/21723450</link><pubDate>Thu, 23 May 2013 06:14:44 GMT</pubDate><description><![CDATA[<p>National Changhua University of Education, Taiwan<br/></p><p>
          Publications: 10</p><p>
          Citation Count: 78</p><p>
          G-index: 8</p><p>
         Field Rating: 3</p><p>Fields of study: <a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=7&subDomainID=13&last=0&start=1&end=100">Business Administration &#38; Economics</a><span class="span-break" >,&nbsp;</span><a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=8&subDomainID=9&last=0&start=1&end=100">Manufacturing Technology</a><span class="span-break" >,&nbsp;</span><a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=9&subDomainID=0&last=0&start=1&end=100">Environmental Sciences</a><br/></p><p>Homepage:
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          Permanent Link:
          <a href="http://academic.research.microsoft.com/Author/21723450">http://academic.research.microsoft.com/Author/21723450</a></p>]]></description><guid isPermaLink="false">2172353838National Changhua University of Education, Taiwan</guid></item><item><title>The critical factors for implementing the quality system of ISO/TS 16949 in automobile parts industry in Taiwan</title><link>http://academic.research.microsoft.com/Publication/57857874</link><pubDate>Thu, 23 May 2013 06:14:44 GMT</pubDate><guid isPermaLink="false">2172345057857874</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/55158517'>Tsu-Ming Yeh</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a>,  <a href='http://academic.research.microsoft.com/Author/50372005'>Kai-I Huang</a></dl><p></p><p>TOTAL QUAL MANAG BUS EXCELL, vol. ahead-of-p, no. ahead-of-p, pp. 1-19, 2012</p><p />]]></description></item><item><title>Applying the Technology Acceptance Model to the introduction of healthcare information systems</title><link>http://academic.research.microsoft.com/Publication/49139031</link><pubDate>Thu, 23 May 2013 06:14:43 GMT</pubDate><guid isPermaLink="false">2172345049139031</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a>,  <a href='http://academic.research.microsoft.com/Author/50372005'>Kai-I Huang</a></dl><p></p><p>TECHNOL FORECAST SOC CHANGE, vol. 78, no. 4, pp. 650-660, 2011</p><p>(Citations:2)</p>]]></description></item><item><title>Retailer's optimal sourcing strategy by using one major supplier and one emergent supplier</title><link>http://academic.research.microsoft.com/Publication/15242403</link><pubDate>Thu, 23 May 2013 06:14:42 GMT</pubDate><guid isPermaLink="false">2172345015242403</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/10269817'>David M. Chiang</a>,  <a href='http://academic.research.microsoft.com/Author/12718898'>Ruey-Shan Guo</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a></dl><p></p><p>Optimization Letters, vol. 5, no. 2, pp. 319-331, 2011</p><p />]]></description></item><item><title>Methods for determining areas for improvement based on the design of customer surveys</title><link>http://academic.research.microsoft.com/Publication/37451679</link><pubDate>Thu, 23 May 2013 06:14:41 GMT</pubDate><guid isPermaLink="false">2172345037451679</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/53701767'>Ching-Chow Yang</a>,  <a href='http://academic.research.microsoft.com/Author/5213649'>King-Jang Yang</a>,  <a href='http://academic.research.microsoft.com/Author/55158517'>Tsu-Ming Yeh</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a></dl><p></p><p>SERV IND J, vol. 29, no. 2, pp. 143-154, 2009</p><p>(Citations:3)</p>]]></description></item><item><title>Evaluating the business value of RFID: Evidence from five case studies</title><link>http://academic.research.microsoft.com/Publication/26235740</link><pubDate>Thu, 23 May 2013 06:14:40 GMT</pubDate><guid isPermaLink="false">2172345026235740</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/28421233'>Shiou-Fen Tzeng</a>,  <a href='http://academic.research.microsoft.com/Author/53628325'>Wun-Hwa Chen</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a></dl><p></p><p>INT J PROD ECON, vol. 112, no. 2, pp. 601-613, 2008</p><p>(Citations:59)</p>]]></description></item><item><title>The analysis of the implementation status of Six Sigma: an empirical study in Taiwan</title><link>http://academic.research.microsoft.com/Publication/27509015</link><pubDate>Thu, 23 May 2013 06:14:39 GMT</pubDate><guid isPermaLink="false">2172345027509015</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/22624494'>King Jang Yang</a>,  <a href='http://academic.research.microsoft.com/Author/22279078'>Tsu Ming Yeh</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan Yun Pai</a>,  <a href='http://academic.research.microsoft.com/Author/13044667'>Ching Chow Yang</a></dl><p></p><p>International Journal of Six Sigma and Competitive Advantage, vol. 4, no. 1, 2008</p><p>(Citations:3)</p>]]></description></item><item><title>The Construction of a Real-Time WIP Exception Monitoring System for Semiconductor Industry</title><link>http://academic.research.microsoft.com/Publication/50709944</link><pubDate>Thu, 23 May 2013 06:14:38 GMT</pubDate><guid isPermaLink="false">2172345050709944</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/55158517'>Tsu-Ming Yeh</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a>,  <a href='http://academic.research.microsoft.com/Author/2987691'>Ching-Shih Tsou</a></dl><p></p><p>WiCom, 2008</p><p />]]></description></item><item><title>Multi-objectives exception management model for semiconductor back-end environment under turnkey service</title><link>http://academic.research.microsoft.com/Publication/26919183</link><pubDate>Thu, 23 May 2013 06:14:37 GMT</pubDate><guid isPermaLink="false">2172345026919183</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/3516532'>R.-S. Guo</a>,  <a href='http://academic.research.microsoft.com/Author/10269817'>D. M. Chiang</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>F.-Y. Pai</a></dl><p></p><p>PRODUCTION PLANNING CONTROL, vol. 18, no. 3, pp. 203-216, 2007</p><p>(Citations:5)</p>]]></description></item><item><title>A WIP-based exception-management model for integrated circuit back-end production processes</title><link>http://academic.research.microsoft.com/Publication/26105345</link><pubDate>Thu, 23 May 2013 06:14:36 GMT</pubDate><guid isPermaLink="false">2172345026105345</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12718898'>Ruey-Shan Guo</a>,  <a href='http://academic.research.microsoft.com/Author/10269817'>David M. Chiang</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a></dl><p></p><p>INT J ADV MANUF TECHNOL, vol. 33, no. 11, pp. 1263-1274, 2007</p><p>(Citations:4)</p>]]></description></item><item><title>Evolutionary business models and inter-firm engineering processes between the foundry and fabless in the semiconductor industry</title><link>http://academic.research.microsoft.com/Publication/50628819</link><pubDate>Thu, 23 May 2013 06:14:35 GMT</pubDate><guid isPermaLink="false">2172345050628819</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/12718898'>Ruey-Shan Guo</a>,  <a href='http://academic.research.microsoft.com/Author/7637686'>Yea-Huey Su</a>,  <a href='http://academic.research.microsoft.com/Author/56847849'>Su-Fen Chiu</a>,  <a href='http://academic.research.microsoft.com/Author/21723450'>Fan-Yun Pai</a>,  <a href='http://academic.research.microsoft.com/Author/56349129'>Chung-Pin Yeh</a></dl><p></p><p>eMDC, pp. 1-4, 2007</p><p>(Citations:2)</p>]]></description></item></channel></rss>