<?xml version="1.0" encoding="utf-8"?><rss version="2.0"><channel><title>RSS for Min Koo Kim</title><link>http://academic.research.microsoft.com/Rss.aspx?id=50835384</link><description>Search RSS feed for Microsoft Academic Search</description><generator>MSRA Libra RSS Burner</generator><copyright>(c)2008 Microsoft Corpration, All right reserved.</copyright><pubDate>Thu, 23 May 2013 16:31:01 GMT</pubDate><lastBuildDate>Thu, 23 May 2013 16:31:01 GMT</lastBuildDate><category /><item><title>Min Koo Kim (Personal Info)
      </title><link>http://academic.research.microsoft.com/Author/50835384</link><pubDate>Thu, 23 May 2013 16:31:01 GMT</pubDate><description><![CDATA[<p>Korea Advanced Institute of Science &amp; Technology<br/></p><p>
          Publications: 2</p><p>
          Citation Count: 0</p><p>
          G-index: 0</p><p>
         Field Rating: 0</p><p>Fields of study: <a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=5&subDomainID=0&last=0&start=1&end=100">Chemistry</a><span class="span-break" >,&nbsp;</span><a href="http://academic.research.microsoft.com/RankList?entitytype=2&topDomainID=8&subDomainID=0&last=0&start=1&end=100">Engineering</a><br/></p><p>Homepage:
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          <a href="http://academic.research.microsoft.com/Author/50835384">http://academic.research.microsoft.com/Author/50835384</a></p>]]></description><guid isPermaLink="false">5083538600Korea Advanced Institute of Science &amp; Technology</guid></item><item><title>Impedance based damage detection under varying temperature and loading conditions</title><link>http://academic.research.microsoft.com/Publication/49480819</link><pubDate>Thu, 23 May 2013 16:31:01 GMT</pubDate><guid isPermaLink="false">5083538449480819</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/50159792'>Hyung Jin Lim</a>,  <a href='http://academic.research.microsoft.com/Author/50835384'>Min Koo Kim</a>,  <a href='http://academic.research.microsoft.com/Author/10641489'>Hoon Sohn</a>,  <a href='http://academic.research.microsoft.com/Author/51557005'>Chan Yik Park</a></dl><p></p><p>NDT E INT, vol. 44, no. 8, pp. 740-750, 2011</p><p />]]></description></item><item><title>Investigating electro-mechanical signals from collocated piezoelectric wafers for the reference-free damage diagnosis of a plate</title><link>http://academic.research.microsoft.com/Publication/53943221</link><pubDate>Thu, 23 May 2013 16:31:00 GMT</pubDate><guid isPermaLink="false">5083538453943221</guid><description><![CDATA[<dl><a href='http://academic.research.microsoft.com/Author/18439940'>Eun Jin Kim</a>,  <a href='http://academic.research.microsoft.com/Author/50835384'>Min Koo Kim</a>,  <a href='http://academic.research.microsoft.com/Author/10641489'>Hoon Sohn</a>,  <a href='http://academic.research.microsoft.com/Author/47341244'>Hyun Woo Park</a></dl><p></p><p>SMART MATER STRUCT, vol. 20, no. 6, 2011</p><p />]]></description></item></channel></rss>