<?xml version="1.0" encoding="utf-8"?><rss version="2.0"><channel><title>RSS for Oxide-Tunneling Leakage Suppressed SRAM for Sub65-nm Very Large Scale Integrated Circuits</title><link>http://academic.research.microsoft.com/Rss.aspx?cata=9&amp;id=39333161</link><description>Search RSS feed for Microsoft Academic Search</description><generator>MSRA Libra RSS Burner</generator><copyright>(c)2008 Microsoft Corpration, All right reserved.</copyright><pubDate>Tue, 18 Jun 2013 23:39:56 GMT</pubDate><lastBuildDate>Tue, 18 Jun 2013 23:39:56 GMT</lastBuildDate><category /><item><title>Oxide-Tunneling Leakage Suppressed SRAM for Sub65-nm Very Large Scale Integrated Circuits</title><link>http://academic.research.microsoft.com/Publication/39333161</link><pubDate>Tue, 18 Jun 2013 16:39:56 GMT</pubDate><guid isPermaLink="false">393331610</guid><description><![CDATA[<div><a href="http://academic.research.microsoft.com/Author/3834784">Ji-Hye Bong</a>, <a href="http://academic.research.microsoft.com/Author/22452355">Kwan-Hee Jo</a>, <a href="http://academic.research.microsoft.com/Author/1049376">Kyeong-Sik Min</a>, <a href="http://academic.research.microsoft.com/Author/2284644">Sung-Mo Kang</a>:
            
            <span style="margin-left:20px" /><span style="margin-left:20px"><a href="http://dx.doi.org/10.1166/jolpe.2011.1119">view publication</a></span></div><div></div><div></div><div>Journal: <a href="http://academic.research.microsoft.com/Journal/883">Journal of Low Power Electronics - JOLPE</a>, vol. 7, no. 1, pp. 87-95, 2011</div><div />]]></description></item></channel></rss>